Radiation Effects in Advanced Semiconductor Materials and Devices (Springer Series in Materials Science)
C. Claeys, E. Simoen
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
种类:
年:
2010
出版:
Softcover reprint of hardcover 1st ed. 2002
出版社:
Springer
语言:
english
页:
424
ISBN 10:
3642077781
文件:
DJVU, 5.36 MB
IPFS:
,
english, 2010
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